Method of health performance evaluation and fault prognostics for electronic equipment

被引：1
|
作者：
Xu, Yu-Liang [1 ]
Sun, Ji-Zhe [1 ]
Chen, Xi-Hong [1 ]
Wang, Guang-Ming [1 ]
机构：
[1] Missile Institute, Air Force Engineering University, Sanyuan 713800, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2012年 / 34卷 / 05期
关键词：
D O I：
10.3969/j.issn.1001-506X.2012.05.38
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1068 / 1072
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