A low redundancy radiation hardened scheme for double error detection and correction in memories

被引：0
|
作者：
Zhu, Ming [1 ]
Zhu, Heng-Jing [1 ]
Liu, Ying-Hui [1 ]
Yu, Qing-Kui [1 ]
Tang, Min [1 ]
机构：
[1] Electronic Components Reliability Center, China Academy of Space Technology, Beijing,100094, China
来源：
Yuhang Xuebao/Journal of Astronautics | 2014年 / 35卷 / 08期
关键词：
D O I：
10.3873/j.issn.1000-1328.2014.08.009
中图分类号：
学科分类号：
摘要：
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收藏
页码：924 / 930
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