Influence of Ag layer thickness on the properties of ZnO/Ag/ZnO films

被引：0
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作者：
Li, Jun [1 ]
Yan, Jinliang [1 ]
Sun, Xueqing [1 ]
Li, Kewei [1 ]
Yang, Chunxiu [1 ]
机构：
[1] School of Physics and Electronic Engineering, Ludong University, Yantai 264025, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2007年 / 28卷 / 09期
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页码：1402 / 1405
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