Contact conductance measurement of locally suspended graphene on SiC

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作者：
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corp., 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan [1 ]
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来源：
Appl. Phys. Express | / 4卷
关键词：
Compendex;
D O I：
045101
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学科分类号：
摘要：
Silicon carbide
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