Combined effect of total ionizing dose and electromagnetic pulse on MOSFET devices

Theoretical and experimental research on the combined effect of total ionizing dose (TID) and electromagnetic pulses (EMP) is helpful to develop hardening techniques for semiconductor devices. In this work, a numeric model for the comprehension of the combined effect of TID and EMP on MOSFET devices is developed with the semiconductor device simulation software TCAD. Simulation results show that the NMOS and PMOS devices will exhibit more severe leakage current increase and sub-threshold characteristics degradation in the combined environment. In addition, the potential influence of doping concentration and gate length on the performance of the MOSFET in the combined environment is discussed.