Extraction method of faint fault feature based on wavelet-SVD difference spectrum

被引：0
|
作者：
Zhao, Xuezhi [1 ]
Ye, Bangyan [1 ]
Chen, Tongjian [1 ]
机构：
[1] School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou 510640, China
来源：
Jixie Gongcheng Xuebao/Journal of Mechanical Engineering | 2012年 / 48卷 / 07期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Singular value decomposition
引用
收藏
页码：37 / 48
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