Surface structure of thin asymmetric PS-b-PMMA diblock copolymers investigated by atomic force microscopy

被引：0
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作者：
Khaydarov, A.A. [1 ]
Hamley, I.W. [2 ]
Legge, Thomas M. [3 ]
Perrier, Sébastien [3 ]
机构：
[1] Department of Energetic, Ferghana Polytechnic Institute, Ferghana street, 86, 712033 Ferghana, Uzbekistan
[2] Department of Chemistry, University of Leeds, Leeds, LS2 9JT, United Kingdom
[3] Department of Colour and Polymer Chemistry, University of Leeds, Leeds, LS2 9JT, United Kingdom
来源：
European Polymer Journal | 2007年 / 43卷 / 03期
关键词：
Asymmetric poly(styrene-b-methyl methacrylate) (PS-b-PMMA) diblock copolymers of molecular weight Mn = 29,700 g mol-1 (MPS = 9300 g mol-1 MPMMA = 20,100 g mol-1, PD = 1.15, χPS = 0.323, χPMMA = 0.677) and Mn = 63,900 g mol-1 (MPS = 50,500 g mol-1, MPMMA = 13,400 g mol-1, PD = 1.18, χPS = 0.790, χPMMA = 0.210) were prepared via reversible addition-fragmentation chain transfer (RAFT) polymerization. Atomic force microscopy (AFM) was used to investigate the surface structure of thin films, prepared by spin-coating the diblock copolymers on a silicon substrate. We show that the nanostructure of the diblock copolymer depends on the molecular weight and volume fraction of the diblock copolymers. We observed a perpendicular lamellar structure for the high molar mass sample and a hexagonal-packed cylindrical patterning for the lower molar mass one. Small-angle X-ray scattering investigation of these samples without annealing did not reveal any ordered structure. Annealing of PS-b-PMMA samples at 160 °C for 24 h led to a change in surface structure. © 2006 Elsevier Ltd. All rights reserved;
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页码：789 / 796
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