Analog circuit fault diagnosis based on cross-entropy method and support vector machine

被引：0
|
作者：
Tang, Jing-Yuan [1 ]
Shi, Yi-Bing [1 ]
Zhou, Long-Fu [1 ]
Zhang, Wei [1 ]
机构：
[1] School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
来源：
Kongzhi yu Juece/Control and Decision | 2009年 / 24卷 / 09期
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D O I：
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学科分类号：
摘要：
11
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页码：1416 / 1420
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