Plasma window characterization

被引：0
|
作者：
Krasik, Ya.E. [1 ]
Gleizer, S. [1 ]
Gurovich, V. [1 ]
Kronhaus, I. [1 ]
Hershcovitch, A. [2 ]
Nozar, P. [3 ]
Taliani, C. [3 ]
机构：
[1] Physics Department, Technion, 32000 Haifa, Israel
[2] Brookhaven National Laboratory, NY 11973-5000
[3] Istituto per Lo Studio Dei Materiali Nanostrutturati, 40 129 Bologna, Italy
来源：
Journal of Applied Physics | 2007年 / 101卷 / 05期
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