A novel histogram test for estimating integral nonlinearity errors of analog-to-digital converters

被引：0
|
作者：
Wu, Minshun [1 ]
Chen, Guican [1 ]
Zhang, Ruizhi [1 ]
Cheng, Jun [1 ]
机构：
[1] School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2009年 / 43卷 / 08期
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页码：59 / 63
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