Raman spectroscopy of In2S3: Ag thin films

被引:0
|
作者
机构
[1] Lin, Si-Le
[2] Ma, Jing
[3] Cheng, Shu-Ying
来源
Ma, J. | 1600年 / Journal of Functional Materials, P.O. Box 1512, Chongqing, 630700, China卷 / 44期
关键词
Raman spectroscopy;
D O I
10.3969/j.issn.1001-9731.2013.18.031
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Micro Structural Analysis of In2S3 Thin Films by Raman Spectroscopy
    H. Izadneshana
    V. F. Gremenok
    Journal of Applied Spectroscopy, 2014, 81 : 765 - 770
  • [2] Micro Structural Analysis of In2S3 Thin Films by Raman Spectroscopy
    Izadneshana, H.
    Gremenok, V. F.
    JOURNAL OF APPLIED SPECTROSCOPY, 2014, 81 (05) : 765 - 770
  • [3] Electrical transport of sprayed In2S3:Ag thin films
    Tiss, B.
    Bouguila, N.
    Kraini, M.
    Khirouni, K.
    Vazquez-Vazquez, C.
    Cunha, L.
    Moura, C.
    Alaya, S.
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2020, 114 (114)
  • [4] Influence of Ag and Sn incorporation in In2S3 thin films
    Lin Ling-Yan
    Yu Jin-Ling
    Cheng Shu-Ying
    Lu Pei-Min
    CHINESE PHYSICS B, 2015, 24 (07)
  • [5] Influence of Ag and Sn incorporation in In2S3 thin films
    林灵燕
    俞金玲
    程树英
    陆培民
    Chinese Physics B, 2015, (07) : 541 - 545
  • [6] STRUCTURE OF IN2S3 THIN-FILMS
    KITAEV, GA
    DVOININ, VI
    USTYANTSEVA, AV
    BELYAEVA, MN
    SKORNYAKOV, LG
    INORGANIC MATERIALS, 1976, 12 (10) : 1448 - 1450
  • [7] Optical Properties of In2S3 Thin Films
    I. V. Bodnar
    V. A. Polubok
    Journal of Applied Spectroscopy, 2014, 81 : 881 - 884
  • [8] Optical Properties of In2S3 Thin Films
    Bodnar, I. V.
    Polubok, V. A.
    JOURNAL OF APPLIED SPECTROSCOPY, 2014, 81 (05) : 881 - 884
  • [9] Study of the electrodeposition of In2S3 thin films
    Asenjo, B
    Chaparro, AM
    Gutiérrez, MT
    Heffero, J
    Maffiotte, C
    THIN SOLID FILMS, 2005, 480 : 151 - 156
  • [10] Electrical Behavior and Photocatalytic Activity of Ag-Doped In2S3 Thin Films
    B. Tiss
    A. Ben Fradj
    N. Bouguila
    D. Cristea
    C. Croitoru
    M. Kraini
    C. Vázquez-Vázquez
    L. Cunha
    C. Moura
    S. Alaya
    Journal of Electronic Materials, 2021, 50 : 3739 - 3747