Analysis of the probability of voltage instability based on Thevenin equivalent parameters

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作者：
An, Tian-Yu [1 ]
Zhou, Su-Quan [1 ]
机构：
[1] School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China
来源：
Harbin Gongcheng Daxue Xuebao/Journal of Harbin Engineering University | 2008年 / 29卷 / 03期
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页码：237 / 241
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