Analysis of measurement uncertainty of X-ray dose rate

被引：5

作者：

Cong P. ^{[1
]}

Chen W. ^{[1
]}

Han J. ^{[1
]}

Guo N. ^{[1
]}

Su Z. ^{[1
]}

Zhang X. ^{[1
]}

Sun J. ^{[1
]}

Wang L. ^{[1
]}

机构：

[1] Northwest Institute of Nuclear Technology, Xi'an 710024

来源：

Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams | 2010年 / 22卷 / 11期

关键词：

Dose rate; Pulse width; Radiation effect; Thermoluminescence dosemeter; Uncertainty; X-ray;

D O I：

10.3788/HPLPB20102211.2773

中图分类号：

学科分类号：

摘要：

The measurement of short pulse X-ray of high energy produced by Qiangguang I accelerator for radiation effect study includes X-ray dose and pulse duration measuring. The thermoluminescence dosemeter (TLD) is used to measure X-ray dose, and the PIN semiconductor detector is employed for recording waveforms of X-ray. The dose rate is calculated out by the results of X-ray dose and pulse duration. By the mathematic model of uncertainty, factors with important effect on X-ray measuring are analyzed. For the measurement uncertainty of X-ray pulse duration is 3.7%, the measuring of X-ray dose with relative standard uncertainty of 25.1% plays a crucial role in determining X-ray dose rate, and the expanded uncertainty of dose rate is about 50.8% with confidence probability of 95%.

引用

页码：2773 / 2777

页数：4

共 16 条

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