Scan matching technology of scanning thermal imager

被引：0
|
作者：
Sui, Xiu-Bao [1 ]
Chen, Qian [1 ]
Gu, Guo-Hua [1 ]
机构：
[1] School of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, China
来源：
Nanjing Li Gong Daxue Xuebao/Journal of Nanjing University of Science and Technology | 2008年 / 32卷 / 04期
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摘要：
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页码：492 / 495
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