Review: Geometric interpretation of reflection and transmission RHEED patterns

被引：0
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作者：
Hafez, Mohamed A. [1 ]
Zayed, Mohamed K. [2 ,3 ]
Elsayed-Ali, Hani E. [4 ,5 ]
机构：
[1] Department of Laser Sciences and Interactions, National Institute of Laser Enhanced Sciences, Cairo University, Giza,12613, Egypt
[2] Department of Physics, College of Science, Taibah University, P. O. Box 30002, Prince Naif Road, Almadinah Almunawarah, Saudi Arabia
[3] Physics Department, Faculty of Science, Bani-Suief University, Bani-Suief,6111, Egypt
[4] Applied Research Center, Old Dominion University, Newport News,VA,23606, United States
[5] Department of Electrical and Computer Engineering, Old Dominion University, Norfolk,VA,23529, United States
来源：
Micron | 2022年 / 159卷
关键词：
III-V semiconductors;
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