A coverage directed test generation platform for microprocessors using genetic approach

被引：0
|
作者：
Shen, Haihua [1 ,2 ]
Wang, Pengyu [1 ,2 ,3 ]
Wei, Wenli [1 ,2 ,3 ]
Guo, Qi [1 ,2 ,3 ]
机构：
[1] Key Laboratory of Computer System and Architecture, Chinese Academy of Sciences, Beijing 100190, China
[2] Research Center of Microprocessor Technology, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100190, China
[3] Graduate University of Chinese Academy of Sciences, Beijing 100049, China
来源：
Jisuanji Yanjiu yu Fazhan/Computer Research and Development | 2009年 / 46卷 / 10期
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页码：1611 / 1625
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