Power-law stress and creep relaxations of single cells measured by colloidal probe atomic force microscopy

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Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan [1 ]
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Jpn. J. Appl. Phys. | 1600年 / 8 PART 3卷
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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摘要：
Cell culture - Probes - Creep - Silica - Atomic force microscopy - Frequency domain analysis
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