Polarization retention on short, intermediate, and long time scales in ferroelectric thin films

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作者：
Lou, X.J. [1 ]
机构：
[1] Department of Materials Science and Engineering, National University of Singapore, Singapore 117574, Singapore
来源：
Journal of Applied Physics | 2009年 / 105卷 / 09期
关键词：
We developed a model with no adjustable parameter for retention loss at short and long time scales in ferroelectric thin-film capacitors. We found that the predictions of this model are in good agreement with the experimental observations in the literature. In particular; it explains why a power-law function shows better fitting than a linear-log relation on a short time scale (10-7s to 1s) and why a stretched exponential relation gives more precise description than a linear-log plot on a long time scale (>100 s); as reported by many researchers in the past. More severe retention losses at higher temperatures and in thinner films have also been correctly predicted by the present theory. © 2009 American Institute of Physics;
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