Optimization of analog circuit fault diagnosis parameters based on SVM and genetic algorithm

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[1] Jing, Tang
[2] Yunan, Hu
[3] Zhicai, Xiao
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Jing, T. | 1600年 / Advanced Institute of Convergence Information Technology卷 / 04期
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D O I：
10.4156/AISS.vol4.issue4.6
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