Effects of cooling rates on microstructure and microhardness of lead-free Sn-3.5%Ag solders

被引:49
|
作者
Shen, Jun [1 ]
Liu, Yong-Chang [1 ]
Han, Ya-Jing [1 ]
Gao, Hou-Xiu [1 ]
Wei, Chen [1 ]
Yang, Yu-Qin [1 ]
机构
[1] College of Materials Science and Engineering, Tianjin University, Tianjin 300072, China
关键词
D O I
10.1016/S1003-6326(06)60011-3
中图分类号
学科分类号
摘要
引用
收藏
页码:59 / 64
相关论文
共 50 条
  • [1] Effects of cooling rates on microstructure and microhardness of lead-free Sn-3.5%Ag solders
    沈骏
    刘永长
    韩雅静
    高后秀
    韦晨
    杨渝钦
    Transactions of Nonferrous Metals Society of China, 2006, (01) : 59 - 64
  • [2] Effects of cooling rates on microstructure and microhardness of lead-free Sn-3.5%Ag solders
    Shen, J
    Liu, YC
    Han, YJ
    Gao, HX
    Wei, C
    Yang, YQ
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 2006, 16 (01) : 59 - 64
  • [3] Creep deformation of lead-free Sn-3.5 Ag-Bi solders
    Shin, S.W., 1600, Japan Society of Applied Physics (42):
  • [4] Effects of microstructure on the creep properties of the lead-free Sn-3.5Ag-Cu solders
    Joo, DK
    Yu, J
    52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, : 1221 - 1225
  • [5] Effects of rapid solidification on the microstructure and microhardness of a lead-free Sn-3.5Ag solder
    Shen Jun
    Liu Yongchang
    Han Yajing
    Gao Houxiu
    RARE METALS, 2006, 25 (04) : 365 - 370
  • [7] Effects of the melt state on the microstructure of a Sn-3.5% Ag solder at different cooling rates
    Li, Xiaoyun
    Zu, Fangqiu
    Gao, Wenlong
    Cui, Xiao
    Wang, Lifang
    Ding, Guohua
    APPLIED SURFACE SCIENCE, 2012, 258 (15) : 5677 - 5682
  • [8] Effect of variation of microstructure on the creep and rupture strengths of a Sn-3.5% Ag lead-free solder alloy
    Wu, KP
    Wade, N
    Yamada, S
    Miyahara, K
    ZEITSCHRIFT FUR METALLKUNDE, 2004, 95 (03): : 185 - 188
  • [9] Tensile properties of Sn-3.5Ag and Sn-3.5Ag-0.75Cu lead-free solders
    Shohji, I
    Yoshida, T
    Takahashi, T
    Hioki, S
    MATERIALS TRANSACTIONS, 2002, 43 (08) : 1854 - 1857
  • [10] Creep rupture of lead-free Sn-3.5Ag-Cu solders
    Joo, DK
    Yu, J
    Shin, SW
    JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (06) : 541 - 547