Applying method of wavelet de-noising to measuring dielectric loss factor of high voltage electrical equipment

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作者：
Li, Xue-Wen [1 ]
Sun, Ke-Ping [1 ]
机构：
[1] Research Section of Electrostatics, Shanghai Maritime University, Shanghai 200135, China
来源：
Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology | 2009年 / 29卷 / SUPPL. 2期
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页码：52 / 55
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