Defect detection in fabrics using local binary patterns

被引：0
|
作者：
Li, Pengfei [1 ]
Lin, Xuan [1 ]
Jing, Junfeng [1 ]
Zhang, Lei [1 ]
机构：
[1] Xi’an Polytechnic University, College of Electronical and Information, Xi’an, Shaanxi,710048, China
来源：
Communications in Computer and Information Science | 2014年 / 437卷
关键词：
Local binary pattern;
D O I：
10.1007/978-3-662-45498-5_31
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：274 / 283
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