Development of a micro-sized thermal contact sensor for inspection of surface defects

被引：0
|
作者：
机构：
[1] Shimizu, Yuki
[2] Lu, Wenjian
[3] Ohba, Yuta
[4] Gao, Wei
来源：
| 1600年 / Fuji Technology Press卷 / 07期
关键词：
Surface defects;
D O I：
10.20965/ijat.2013.p0708
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