Preface to special topic: Piezoresponse force microscopy and nanoscale phenomena in polar materials

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[1] Bassiri-Gharb, Nazanin
[2] Kalinin, Sergei V.
[3] Valanoor, Nagarajan
来源：
Valanoor, N. (nagarajan@unsw.edu.au) | 1600年 / American Institute of Physics Inc.卷 / 116期
关键词：
The present special issue of the Journal of Applied Physics contained selected papers from the 13th and 14th International Conference on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials; held in Nanjing; China and Prague; The Czech Republic in July 2013. This conference was jointly held with the 22nd IEEE International Symposium on Application of Ferroelectrics (ISAF). These meeting continued the series of Piezoresponse Force Microscopy Conferences and Workshops first started in 2007 in Oak Ridge; US. The workshops comprised of tutorials on fundamentals of PFM operation; relevant instrumental advancements; image and electromechanical response interpretation; along with experimental hands-on classes in the PFM laboratories equipped with modern PFM setups. The Prague and Nanjing workshops featured a set of invited and contributed talks on principles and applications of PFM; with the selected papers presented in this special issue;
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