Radiation damage effect on charge-coupled devices during 60Co gamma ray and electron irradiation

被引：0
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作者：
Li, Peng-Wei [1 ,2 ]
Guo, Qi [1 ]
Ren, Di-Yuan [1 ]
Yu, Yue [1 ,2 ]
Wang, Yi-Yuan [1 ,2 ]
Gao, Bo [1 ,2 ]
机构：
[1] Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China
[2] Graduate University of Chinese Academy of Sciences, Beijing 100049, China
来源：
Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2010年 / 44卷 / 01期
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页码：124 / 128
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