Characterization of oxidic and organic materials with synchrotron radiation based XPS and XAS

被引：0
|
作者：
Schmeisser, D. [1 ]
Tallarida, M. [1 ]
Henkel, K. [1 ]
Müller, K. [1 ]
Mandal, D. [1 ]
Chumakov, D. [2 ]
Zschech, E. [2 ]
机构：
[1] Applied Physics Sensors, Brandenburg Technical University Cottbus, Konrad-Wachsmann-Allee 17, 03046 Cottbus, Germany
[2] AMD Saxony, Wilschdorfer Landstr. 101, 01109 Dresden, Germany
来源：
Materials Science- Poland | 2009年 / 27卷 / 01期
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页码：141 / 157
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