Characterization of power spectral density of optical surface

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作者：
MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai [1 ]
200092, China
不详 [2 ]
200092, China
机构：
来源：
Hongwai yu Jiguang Gongcheng Infrared Laser Eng. | / 12卷 / 3707-3712期
关键词：
Engineering Village;
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摘要：
Geometric mean - High frequency HF - Low-spatial frequency - MATLAB program - Optical surfaces - Power spectral densities (PSD) - Si substrates - Spatial frequency
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