Research on 9 kHz-1 GHz Broadband and High-Power Injection Probe With Low Loss for Time-Domain Conducted Immunity Measurement

被引：0

作者：

Fu, Changshun ^{[1
]}

Yan, Zhaowen ^{[1
]}

Xing, Siyi ^{[1
]}

Zhao, Yinhua ^{[1
]}

Chen, Ying ^{[1
]}

Hu, Kunkun ^{[1
]}

机构：

[1] Beihang Univ, Sch Elect & Informat Engn, Beijing 100191, Peoples R China

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2024年 / 73卷

基金：

中国国家自然科学基金;

关键词：

Broadband and high-power injection probe (BHIP); conducted immunity (CI); electromagnetic susceptibility (EMS); integrated circuits; parallel resistance impedance matching; symmetrical winding; BULK CURRENT INJECTION; CIRCUIT;

D O I：

10.1109/TIM.2024.3476525

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A 9 kHz-1 GHz broadband and high-power injection probe (BHIP) with low loss for time-domain conducted immunity (CI) measurement is developed in this article. Broadband, high power, and low loss are effective and crucial for time-domain CI measurement of integrated circuits and electronic devices. The factors affecting operating bandwidth, loss, and withstand power are investigated in this article. By using magnetic cores with low magnetic permeability and high operating frequency, parallel resistance impedance matching, low impedance wires, and double-wire parallel wound symmetrical winding, an injection probe with broadband, high power, and low loss was developed. The developed BHIP was calibrated, and S-parameter, coupling energy comparison, high current, and high-power injection tests were conducted, indicating that the developed BHIP has the performance of low loss, high power, and broadband. Meanwhile, the developed BHIP with low loss performs well in time-domain CI measurement and electromagnetic susceptibility testing (EMST) in the 9 kHz-1 GHz frequency range. The results of time-domain CI measurement and EMST are of great significance for obtaining electromagnetic susceptibility (EMS) data and optimizing the electromagnetic compatibility (EMC) design of integrated circuits and electronic devices.

引用

页数：11