Knowledge-Augmented Mutation-Based Bug Localization for Hardware Design Code

被引:0
|
作者
Wu, Jiang [1 ]
Zhang, Zhuo [2 ]
Yang, Deheng [3 ]
Xu, Jianjun [1 ]
He, Jiayu [1 ]
Mao, Xiaoguang [1 ]
机构
[1] Natl Univ Def Technol, Changsha, Hunan, Peoples R China
[2] Xian Univ Technol, Xian, Shaanxi, Peoples R China
[3] Acad Mil Sci Peoples Liberat Army, Beijing, Peoples R China
关键词
Mutation analysis; verification; knowledge-augmented; hardware design code; bug localization; FAULT; REDUCTION;
D O I
10.1145/3660526
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Verification of hardware design code is crucial for the quality assurance of hardware products. Being an indispensable part of verification, localizing bugs in the hardware design code is significant for hardware development but is often regarded as a notoriously difficult and time-consuming task. Thus, automated bug localization techniques that could assist manual debugging have attracted much attention in the hardware community. However, existing approaches are hampered by the challenge of achieving both demanding bug localization accuracy and facile automation in a single method. Simulation-based methods are fully automated but have limited localization accuracy, slice-based techniques can only give an approximate range of the presence of bugs, and spectrum-based techniques can also only yield a reference value for the likelihood that a statement is buggy. Furthermore, formula-based bug localization techniques suffer from the complexity of combinatorial explosion for automated application in industrial large-scale hardware designs. In this work, we propose Kummel, a Knowledge-augmented mutation-based bug localization for hardware design code to address these limitations. Kummel achieves the unity of precise bug localization and full automation by utilizing the knowledge augmentation through mutation analysis. To evaluate the effectiveness of Kummel, we conduct large-scale experiments on 76 versions of 17 hardware projects by seven state-of-the-art bug localization techniques. The experimental results clearly show that Kummel is statistically more effective than baselines, e.g., our approach can improve the seven original methods by 64.48% on average under the RImp metric. It brings fresh insights of hardware bug localization to the community.
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页数:26
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