Estimation of Surface Roughness using AFM Image Adopting 2D FFT And Wavelet Analysis

被引：0
|
作者：
Ganesan, K. [1 ]
Sarathi, R. [1 ]
Thangabalan, B. [1 ]
Danikas, M.G. [2 ]
机构：
[1] Dept of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India
[2] Department of Electrical & Computer Engineering, Democritus University of Thrace (DUTh), Xanthi, Greece
来源：
Proceedings of the International Symposium on Electrical Insulating Materials | 2023年
关键词：
Compendex;
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学科分类号：
摘要：
Surface roughness
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页码：257 / 260
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