Machine learning-based layer-wise detection of overheating anomaly in LPBF using photodiode data

被引：0
|
作者：
Hasan, Nazmul [1 ]
Saha, Apurba Kumar [1 ]
Wessman, Andrew [2 ]
Shafae, Mohammed [1 ]
机构：
[1] Department of Systems and Industrial Engineering, The University of Arizona, Tucson,AZ,85721, United States
[2] Department of Materials Science and Engineering, The University of Arizona, Tucson,AZ,85721, United States
来源：
Manufacturing Letters | 2024年 / 41卷
关键词：
Compendex;
D O I：
10.1016/j.mfglet.2024.09.169
中图分类号：
学科分类号：
摘要：
Access control - Benchmarking - Cluster analysis - Error statistics - Hardware security - Health risks - Laser heating - Linear regression - Population statistics - Public risks - Risk analysis - Risk assessment - Risk perception - Signal sampling
引用
收藏
页码：1423 / 1431
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