共 43 条
- [1] Focused ion beam-secondary ion mass spectrometry analyses of nanostructured thin films SURFACE & COATINGS TECHNOLOGY, 2004, 180 : 323 - 330
- [2] Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique Metallurgical and Materials Transactions A, 1998, 29 : 2399 - 2406
- [3] Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1998, 29 (09): : 2399 - 2406
- [6] Plan view TEM sample preparation using the focused ion beam lift-out technique CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 868 - 872
- [7] Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY OF MATERIALS IV, 1997, 480 : 19 - 27
- [8] Planar TEM analysis of nanoindented samples using the focused ion beam lift-out technique ISTFA 2000: PROCEEDINGS OF THE 26TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2000, : 459 - 461
- [9] Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique JOURNAL OF ELECTRON MICROSCOPY, 2007, 56 (02): : 43 - 49
- [10] Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope Microchimica Acta, 2008, 161 : 421 - 425