Research Progress of Perovskite Direct X-ray Imaging

被引:0
|
作者
Sun X.-J. [1 ]
Xia M.-L. [2 ]
Xu Y.-S. [1 ]
Tang J. [3 ]
Niu G.-D. [3 ]
机构
[1] State Key Laboratory of Silicate Materials for Architectures, Wuhan University of Technology, Wuhan
[2] School of Materials Science and Engineering, Wuhan University of Technology, Wuhan
[3] Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan
来源
基金
中国国家自然科学基金;
关键词
array detector; integrated with TFT; perovskite; X-ray imaging;
D O I
10.37188/CJL.20220119
中图分类号
学科分类号
摘要
X-ray detection is widely used in medical diagnosis, industrial flaw detection, security and other fields, and X-ray array detector is the key part of imaging equipment. High spatial resolution can be achieved by converting X-ray into electrical signals in one step using semiconductor materials. Perovskite material has become the star material of direct X-ray detector in recent years due to its advantages of high X-ray decay ordinal number, long carrier diffusion distance and irradiation stability. This paper briefly introduces the principle, critical nature and core materials of the direct type of X-ray detection, indicates the advantages of halide perovskite in applying in direct X-ray detector and expounds the characteristics and the latest research progress of both perovskite single pixel detector and TFT integrated array detector. Finally, the current technical challenges and potential solutions are put forward, and the future development trend of X-ray detector based on halide perovskite is prospected. © 2022 Chines Academy of Sciences. All rights reserved.
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页码:1014 / 1026
页数:12
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