Direct method for microscale manipulation at liquid-liquid interfaces in ionic liquid media with real-time electron microscopy observation

被引:0
|
作者
Kashin, Alexey S. [1 ]
Ananikov, Valentine P. [1 ]
机构
[1] N.D. Zelinsky Institute of Organic Chemistry, Russian Academy of Sciences, Leninsky Prospect 47, Moscow,119991, Russia
来源
Journal of Ionic Liquids | 2024年 / 4卷 / 02期
基金
俄罗斯科学基金会;
关键词
Electron lenses - Electron microscopes - Soft materials;
D O I
10.1016/j.jil.2024.100116
中图分类号
学科分类号
摘要
A deep understanding of the processes in soft matter systems with liquid-liquid phase boundaries is of particular importance for materials science, chemistry and life sciences. A vast variety of physicochemical techniques have been proposed for the study of interfacial properties of liquid systems. Among them, electron microscopy methods occupy an important place due to the possibility of direct observation of the sample areas of interest with high spatial resolution; however, the harsh conditions of the electron microscope chamber impose significant restrictions on the possibilities of observing and manipulating unprotected liquids and related soft systems. To overcome these difficulties, in this work, we developed a methodology for direct probing of liquid-liquid interfaces with simultaneous control of the process using electron microscopy. Practically relevant liquid mixtures based on vacuum-compatible ionic liquid (IL) with water additives were probed with micrometer accuracy in real time inside an electron microscope chamber, which made it possible to reveal the role of specific ions aggregation and electrostatic phenomena in the stabilization of liquid microdomains. To test the versatility of the proposed approach, the morphology of a typical IL/water mixture was examined using a series of electron microscopes of various configurations, and it was shown that the best level of contrast between two chemically related liquid phases can be obtained in the case of a cold field emission electron source in combination with an in-lens secondary electron detector, regardless of the specific instrument manufacturer. © 2024 The Author(s)
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