Observing multi-frequency structured illumination patterns based on an evanescent field in a millimeter-scale polymer slide

被引：0

作者：

Hu, Yanjun ^{[1
]}

Dai, Xingang ^{[1
]}

Zhang, Hongru ^{[2
]}

Dai, Qun ^{[1
]}

Niu, Bowen ^{[1
]}

Jing, Gaoshan ^{[2
]}

Li, Yuan ^{[3
]}

Fan, Guofang ^{[1
]}

机构：

[1] Beijing Jiaotong Univ, Inst Lightwave Technol, Minist Educ, Key Lab All Opt Network & Adv Telecommun Network, Beijing 100044, Peoples R China

[2] Chinese Acad Sci, Inst Microelect, Beijing 100444, Peoples R China

[3] Shanghai Inst Measurement & Testing Technol, Natl Ctr Testing Technol, Natl Ctr Measurement & Testing East China, Shanghai 201203, Peoples R China

来源：

OPTICS LETTERS | 2024年 / 49卷 / 17期

关键词：

FLUORESCENCE; MICROSCOPY; LIMIT;

D O I：

10.1364/OL.532009

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Millimeter-scale slide optical waveguides (OWGs) show the potential to break the barrier of easy-to-use and versatility for total internal reflection (TIR) fluorescence technology. In this paper, multi-frequency structured illumination (SI) patterns resulting from the evanescent field (EF) on the surface of a millimeter-scale polymer slide OWG are observed by measuring the fluorescence intensity distribution of fluorescent dyes deposited on the top of theOWG. The frequency, intensity, and stability of the SI patterns show a strong dependence on the coupling angle of the incident light (changing with the incident position). The distribution of multi-frequency SI patterns in the frequency space is demonstrated for different numerical aperture (NA) imaging systems (NA= 0.3, 0.6, and 0.8), indicating the potential for enhanced resolution for low NA systems with a simple and cheap polymer slide. (c) 2024 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.

引用

页码：4903 / 4906

页数：4