Study on High-Numerical-Aperture-Focused Characteristics by π Phase Diaphragm Modulation

被引：0
|
作者：
Cai X. [1 ,2 ]
Zhao J. [2 ]
Tong H. [1 ]
Luo J. [3 ]
Yang Y. [3 ]
Li L. [1 ]
机构：
[1] Special and Key Laboratory of Guizhou Provincial Higher Education for Optoelectronic Information Processing, School of Mechatronics Engineering, Guizhou Minzu University, Guiyang, 550025, Guizhou
[2] Department of Physics, School of Science, Zhejiang Science Technology University, Hangzhou, 310018, Zhejiang
[3] Special and Key Laboratory of Guizhou Provincial Higher Education for Green Energy-Saving Materials, School of Material Science and Engineering, Guizhou Minzu University, Guiyang, 550025, Guizhou
来源：
| 1600年 / Chinese Optical Society卷 / 37期
关键词：
Diaphragm; Physical optics; Polarization; Vector beam; π phase plate;
D O I：
10.3788/AOS201737.0526001
中图分类号：
学科分类号：
摘要：
The strong axial electric field component can be obtained in the focus area by an annular diaphragm with a larger radius. In contrast, by another annular diaphragm with a smaller radius which combines with a π phase plate, the axial electric field distribution can be obtained in the focus area with the vibration direction opposite to that of the axial electric field produced by the annular diaphragm with a larger radius. Consequently, the focused spot formed by the annular diaphragm with a larger radius in the focus area is reshaped. In certain conditions, the size of the focused spot can be greatly reduced. The study results show that, compared with that when using sing annular diaphragm, the size reduction of the focused spot with the proposed method can be more than 40 nm. © 2017, Chinese Lasers Press. All right reserved.
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共 17 条
  • [1] Yang L.X., Xie X.S., Wang S.C., Et al., Minimized spot of annular radially polarized focusing beam, Optics Letters, 38, 8, pp. 1331-1333, (2013)
  • [2] Kozawa Y., Sato S., Numerical analysis of resolution enhancement in laser scanning microscopy using a radially polarized beam, Optics Express, 23, 3, pp. 2076-2084, (2015)
  • [3] Zhu B.Z., Shen S.H., Zheng Y., Et al., Numerical studies of focal modulation microscopy in high-NA system, Optics Express, 24, 17, pp. 19138-19147, (2016)
  • [4] Sheppard C.J.R., Choudhury A., Annular pupils, radial polarization, and superresolution, Applied Optics, 43, 22, pp. 4322-4327, (2004)
  • [5] Kozawa Y., Hibi T., Sato A., Et al., Lateral resolution enhancement of laser scanning microscopy by a higher-order radially polarized mode beam, Optics Express, 19, 17, pp. 15947-15954, (2011)
  • [6] Chen Y.K., Zhang D.G., Han L., Et al., Surface-plasmon-coupled emission microscopy with a polarization converter, Optics Letters, 38, 5, pp. 736-738, (2013)
  • [7] Wang H.F., Shi L.P., Lukyanchuk B., Et al., Creation of a needle of longitudinally polarized light in vacuum using binary optics, Nature Photonics, 2, 8, pp. 501-505, (2008)
  • [8] Liu X., Wang J., He C., Et al., Backward focus engineering with controlled cylindrical vector beams under different numerical apertures, Acta Optica Sinica, 34, 1, (2014)
  • [9] Xie X.S., Chen Y.Z., Yang K., Et al., Harnessing the point-spread function for high-resolution far-field optical microscopy, Physical Review Letters, 113, 26, (2014)
  • [10] Dorn R., Quabis S., Leuchs G., Sharper focus for a radially polarized light beam, Physical Review Letters, 91, 23, (2010)
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