Bipolar theory of MOS field-effect transistors and experiments

被引:0
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作者
Sah, Chih-Tang [1 ,2 ,3 ]
Jie, Bin B. [3 ]
机构
[1] Chinese Academy of Sciences, Beijing 100864, China
[2] University of Florida, Gainesville, FL 32605, United States
[3] Peking University, Beijing 100871, China
关键词
Current voltage characteristics - Experiments - MOS devices - MOSFET devices - Static random access storage;
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摘要
The bipolar theory of field-effect transistor is introduced to replace the 55-year-old classic unipolar theory invented by Shockley in 1952 in order to account for the characteristics observed in recent double-gate nanometer silicon MOS field-effect transistors. Two electron and two hole surface channels are simultaneously present in all channel current ranges. Output and transfer characteristics are computed over practical base and gate oxide thicknesses. The bipolar theory corroborates well with experimental data reported recently for FinFETs with metal/silicon and p/n junction source/drain contacts. Single-device realization of CMOS inverter and SRAM memory circuit functions are recognized.
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页码:1497 / 1502
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