Measurements of complex permittivity for dielectric film at millimeter wave frequencies by a cavity resonator

被引：0
|
作者：
Hiromichi Y. [1 ]
Akira N. [1 ]
机构：
[1] Kyocera Corporation 1-4, Kokubu-yamashitacho
来源：
IEEJ Transactions on Electronics, Information and Systems | 2011年 / 131卷 / 07期
关键词：
Cavity resonator; Complex permittivity; Dielectric film; Measurement method; Millimeter wave;
D O I：
10.1541/ieejeiss.131.1287
中图分类号：
学科分类号：
摘要：
A novel cavity resonator method was proposed for measuring the complex permittivity of dielectric plate and film in the millimeter-wave region. In this method, the dielectric plate with film was loaded at the end of the cavity resonator. The measurement principle and the measurement error of the dielectric film were discussed. The complex permittivities of dielectric films were measured at 30 GHz. ©2011 The Institute of Electrical Engineers of Japan.
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页码：1287 / 1292
页数：5
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