Improving x-ray image interpretation and analysis

被引：0

作者：

Butani, Vikram ^{[1
]}

机构：

[1] V.J. Electronix, Division of V.J. Technologies, Bohemia, NY, United States

来源：

Circuits Assembly | 2002年 / 13卷 / 08期

关键词：

Advanced defect recognition (ADR) - Ball grid arrays (BGA);

D O I：

暂无

中图分类号：

学科分类号：

摘要：

(Edited Abstract)

引用

页码：48 / 50

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