共 50 条
- [1] A practical approach to comprehensive system test & debug using boundary scan based test architecture 2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2007, : 989 - 998
- [2] A practical guide to combining ICT & boundary scan testing INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, : 487 - 494
- [3] Practical Case for Boundary-Scan Technology Education at University Journal of Japan Institute of Electronics Packaging, 2021, 24 (07): : 675 - 679
- [4] Hierarchical test approach using boundary scan test 2000 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 2000, : 261 - 266
- [6] A New Approach to Model the Effect of Topology on Testing Using Boundary Scan Journal of Electronic Testing, 2015, 31 : 301 - 310
- [7] An Approach to Generating Test Data Sequences of Boundary Scan Test System PROCEEDINGS OF 2013 IEEE 11TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), 2013, : 264 - 270
- [8] A New Approach to Model the Effect of Topology on Testing Using Boundary Scan JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, 31 (03): : 301 - 310