Bayesian evaluation method for reliability growth test based on the ordered Dirichlet distribution

被引：2
|
作者：
Xing Y. [1 ]
Jiang P. [2 ]
机构：
[1] College of Continuing Education, National University of Defense Technology, Changsha
[2] College of Information System and Management, National University of Defense Technology, Changsha
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2017年 / 39卷 / 05期
关键词：
Bayesian analysis; Expert information; Ordered Dirichlet distribution; Prior distribution; Reliability growth;
D O I：
10.3969/j.issn.1001-506X.2017.05.34
中图分类号：
学科分类号：
摘要：
Considering the characteristic that sample size of products used for the reliability growth test is small, a Bayesian evaluation method for reliability growth test based on the ordered Dirichlet distribution is proposed. Standardized description procedure of expert information during the reliability growth process and prior distribution quantified from expert information in Bayesian framework are figured out by applying statistical features of the ordered Dirichlet distribution. The evaluation method of system reliability at each reliability growth test stage is also presented. Due to combining historic information, subjective information and objective information, the evaluation problem about system reliability growth test under the condition of small sample size is solved efficiently. © 2017, Editorial Office of Systems Engineering and Electronics. All right reserved.
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页码：1178 / 1182
页数：4
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