Explainable AI-infused ultrasonic inspection for internal defect detection

被引:0
|
作者
Karthikeyan, Adithyaa [1 ]
Tiwari, Akash [1 ]
Zhong, Yuhao [1 ]
Bukkapatnam, Satish T.S. [1 ]
机构
[1] Department of Industrial and Systems Engineering, Texas A&M University, College Station, TX, United States
来源
CIRP Annals | 2022年 / 71卷 / 01期
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Quality assurance;
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页码:449 / 452
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