In situ defect quantification and phase identification during flash sintering using Raman spectroscopy

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[1] Murray, Shannon E.
[2] Lv, Guangxin
[3] Sulekar, Soumitra S.
[4] Cahill, David G.
[5] Shoemaker, Daniel P.
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Shoemaker, Daniel P. (dpshoema@illinois.edu) | 1600年 / Blackwell Publishing Inc.卷 / 104期
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