Detection of contacting interface-type defects using ultrasound lock-in thermography

被引：0
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作者：
Liu, Hui [1 ]
Liu, Jun-Yan [1 ]
Wang, Yang [1 ]
机构：
[1] School of Mechatronics Engineering, Harbin Institute of Technology, Harbin 150001, China
来源：
Guangxue Jingmi Gongcheng/Optics and Precision Engineering | 2010年 / 18卷 / 03期
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页码：653 / 661
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