Research on preventive maintenance modeling method of semiconductor devices

被引:0
|
作者
Ao Y. [1 ]
Chang P. [1 ]
机构
[1] School of Electromechanical Engineering, Guangdong University of Technology, Guangzhou
来源
| 2017年 / Systems Engineering Society of China卷 / 37期
基金
中国国家自然科学基金;
关键词
Cost model; Detection period; Opportunity maintenance; Preventive maintenance;
D O I
10.12011/1000-6788(2017)03-0782-08
中图分类号
学科分类号
摘要
Semiconductor production is a complex manufacturing process. The maintenance of semiconductor equipment is costive and difficult. In order to lower maintenance costs and ensure steady operation of the whole production system, this paper strives to make preventive hierarchical maintenance considering opportunity maintenance for a degrading production line. We use the Gamma process to model the equipment degradation process. The objection of maintenance cost was analyzed under different detection periods. Optimization problem was solved through Monte Carlo simulation and renewal theory. The relationship of detecting cost and the detection interval are analyzed with this algorithm. The simulation shows that the preventive maintenance strategy is feasible and effective. © 2017, Editorial Board of Journal of Systems Engineering Society of China. All right reserved.
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页码:782 / 789
页数:7
相关论文
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