SnO2 Separative Structure Extended Gate H+-Ion Sensitive Field Effect Transistor by the Sol-Gel Technology and the Readout Circuit Developed by Source Follower

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作者
Chou, Jung-Chuan [1 ,2 ]
Kwan, Pik-Kwan [1 ]
Chen, Zhi-Jie [1 ]
机构
[1] [1,Chou, Jung-Chuan
[2] Kwan, Pik-Kwan
[3] Chen, Zhi-Jie
来源
Chou, J.-C. (Choujc@pine.yuntech.edu.tw) | 1600年 / Japan Society of Applied Physics卷 / 42期
关键词
Acidity - Alkalinity - Current voltage characteristics - Electrochemistry - Fabrication - Gates (transistor) - Membranes - pH sensors - Readout systems - Sensitivity analysis - Sol-gels - Tin compounds;
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摘要
In this study, the tin oxide membrane, fabricated by the sol-gel technology, was used as the pH-sensing layer of the extended gate H +-ion sensitive field effect transistor (EGFET) device. The sensing membrane was deposited on the silicon substrate. The cost of fabricating the EGFET device by the sol-gel technology is lower than by the other methods. The sensitivity of the sol-gel prepared tin oxide separative structure EGFET device is about 57.63 mV/pH in the range of pH1 to pH9. The readout circuit of the tin oxide EGFET was developed by the source follower.
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页码:6790 / 6794
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