Diffusion of sodium in single crystal CuInSe2

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[1] [1,Forest, Robert V.
[2] McCandless, Brian E.
[3] He, Xiaoqing
[4] Rockett, Angus A.
[5] Eser, Erten
[6] Dobson, Kevin D.
[7] Birkmire, Robert W.
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Birkmire, Robert W. (rwb@udel.edu) | 1600年 / American Institute of Physics Inc.卷 / 121期
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Copper compounds - Fluorine compounds - Indium compounds - Selenium compounds - Surface reactions - Activation energy - Diffusion - Single crystals - High resolution transmission electron microscopy - Dislocations (crystals);
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摘要
The incorporation of sodium from sodium fluoride in single-crystal CuInSe2 (CIS) is investigated to provide insight into the intra-granular aspects of sodium incorporation in CIS-based thin films. Sodium was incorporated by evaporating NaF onto two CIS crystals of varying compositions and defect structures followed by heating under vacuum. Diffusion profiles show a near-surface reaction before a deeper diffusion zone which follows a complementary error function, confirming Na diffusion into the crystals. Transmission electron microscopy analysis indicates that dislocations do not control the diffusion process. The activation energy of diffusion is ∼0.7 eV for both crystals. This low activation energy suggests that Na diffusion occurs rapidly through the bulk at temperatures as low as 300 °C and helps explain the uniform Na concentration often observed in grain interiors of polycrystalline Cu(InGa)Se2 thin films. © 2017 Author(s).
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