Automatic detection method of circuit boards defect based on partition enhanced matching

Automatic detection of circuit boards defect based on the image processing techniques, is affected by the too large size of the circuit boards image and unclear characteristic factors and its detection speed and detection accuracy always needs to be improved. To this end, an automatic detection method of circuit boards defect based on partition enhanced matching was proposed in this study. First, the image of standard board and pending board was divided into some sub-blocks. Second, a piecewise linear transformation method was used in enhancing the characteristics of the image of each sub-block. Finally, gray scale statistical matching method was used to determine whether the sub-lock image is defective. Experimental results show that this detection method can obtain a fast speed and a good accuracy. © 2013 Asian Network for Scientific Information.