Development of single-event effect test system for Flash-based FPGA

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State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an [1 ]
710024, China
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Yuanzineng Kexue Jishu | / 12卷 / 2266-2271期
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10.7538/yzk.2015.49.12.2266
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