Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS

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作者：
Shehata, Andrea Bahgat [1 ]
Stellari, Franco [1 ]
Song, Peilin [1 ]
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[1] IBM T.J. Watson Research Center, Yorktown Heights,NY, United States
来源：
Electronic Device Failure Analysis | 2016年 / 18卷 / 04期
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